What is TOF-SIMS analysis?

ToF-SIMS is an imaging mass spectrometry (MS) technique that allows us to obtain isotopic, elemental, and molecular information from the surface of solid samples.

How does TOF-SIMS work?

How does ToF-SIMS work? ToF-SIMS uses a pulsed primary ion beam (Bin+, Cs+, Ar+, etc.) to impact on a sample surface and induce a fragmentation cascade. The result is the desorption of neutrals, secondary ions (+/-) and electrons from the first few monolayers of the sample.

Why use TOF-SIMS?

The information TOF-SIMS provides about surface layers or thin film structures is important for many industrial and research applications where surface or thin film composition plays a critical role in performance including: nanomaterials, photovoltaics, polymer surface modification, catalysis, corrosion, adhesion.

What is sputtering in TOF-SIMS?

2.4. Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a SIMS technique that focuses a pulsed beam of primary ions onto a sample surface, producing secondary ions in a sputtering process. TOF-SIMS is a technique that detects all the elements in the periodic table, including hydrogen.

How is TOF SIMS used in mass spectrometry?

ToF-SIMS is an imaging mass spectrometry (MS) technique that allows us to obtain isotopic, elemental, and molecular information from the surface of solid samples.

What is the strength of the ToF SIMS?

The strength of ToF-SIMS lies in its capability to detect and identify multiple chemical species inside a 3D space without the need for a marker.

Why is TOF SIMS used in smart chart?

TOF-SIMS is part of the SMART chart and is a very surface sensitive technique providing full​ elemental and molecular analysis with excellent detection limits The surface sensitivity of TOF-SIMS makes it a good first pass at problem solving to give an overview of what types of species are present on a sample.

How are secondary ions used in TOF SIMS?

Analyzing these secondary ions provides information about the molecular, inorganic and elemental species present on the surface. For example, if there were organic contaminants, such as oils adsorbed on the surface, TOF-SIMS would reveal this information, whereas other techniques may not, particularly at very low levels.