Is Ijera UGC approved journal?

International Journal of Engineering Research and Applications (IJERA) is ISO 3297:2007 certified open access and peer reviewed refereed international Journal. You can submit your manuscript by simply mailing on [email protected] in MS Word format. …

Is international journal of computer applications peer reviewed?

Peer-reviewed international journal focusing on high-impact innovations, research outcomes and advances in computer science, engineering and applications.

Where does the IJCA impact factor come from?

The impact factor is derived from the consolidated citation data received via Google Scholar, DOAJ and ProQuest survey under the purview of University of St. Gallen. Self citations are not considered while calculating Impact Factor and Cited Half-Life statistics. Cumulative statistics derived from print and online versions: Statistic 2010 2011 2012

How is impact factor calculated in International Journal of Computer Applications?

Self citations are not considered while calculating Impact Factor and Cited Half-Life statistics. Cumulative statistics derived from print and online versions: International Journal of Computer Applications (IJCA) regularly attempts to improve the impact factor of the journal; with the help of authors, researchers, teachers and students.

How are cumulative statistics derived from print and online versions of IJCA?

Cumulative statistics derived from print and online versions: International Journal of Computer Applications (IJCA) regularly attempts to improve the impact factor of the journal; with the help of authors, researchers, teachers and students. In this regard, we are inviting more international referees to our Reviewer list from the upcoming issues.

What kind of papers are published in Ijca?

The journal publishes papers related with topics including but not limited to Information Systems, Distributed Systems, Graphics and Imaging, Bio-informatics, Natural Language Processing, Software Testing, Human-Computer Interaction, Embedded Systems, Pattern Recognition, Signal Processing